Andy Hillier - 2002 Young Investigator Award


 
Andy Hillier joined the Department of Chemical Engineering at the University of Virginia as an assistant professor in 1996.  He received his B.S. in chemical engineering from the University of Nebraska in 1990 and a Ph.D. in chemical engineering from the University of Minnesota in 1995.  While in Minnesota, Andy worked under the direction of Michael D. Ward.  His Ph.D. research focused on the electrocrystallization of conducting organic films in an effort to understand solid-state directed crystal growth modes and the role of epitaxy in the formation of organic thin films on crystalline surfaces.  Hillier then joined the research group of Allen J. Bard at the University of Texas as a Postdoctoral Associate.  His work at Texas involved using atomic force microscopy to study double layer forces at metal and metal-oxide electrodes, image electrochemically-induced crystal dissolution, and to develop a thermally-driven non-contact AFM imaging technique.

Since joining the faculty at Virginia, Hillierís research has focused on the development of electrochemically-switchable membrane materials; the characterization of surface forces, friction and adhesion at metal and polymer interfaces; and the development of chemical imaging methods combined with gradient sample techniques for the discovery and characterization of electro-oxidation catalysts.  As a faculty member, Hillier has received awards that include the Camille and Henry Dreyfus New Faculty Award (1996), Molecular Imagingís Scanning Probe Microscopist Award (1997), a National Science Foundation CAREER Award (1999) and an Office of Naval Research Young Investigator Award (2000).